A novel SOI MESFET by reducing the electric field crowding for high voltage applications
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference27 articles.
1. Jean-Pierre Raskin, “SOI substrates for More than Moore roadmap”, in: 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS), 2012.
2. A sub- and near-threshold current model for silicon MESFETs;Marshall;IEEE Trans. Electron Devices,1988
3. Fabrication and performances of delta-doped Si n-MESFET grown by MBE;Chen;Electron. Lett.,1993
4. Microwave performance of GaAs-on-Si MESFETs with Si buffer layers;Georagkilas;IEEE Trans. Electron Devices,1993
5. Fabrication and analysis of 1/2μm silicon logic MESFETs;Nulman;IEEE Trans. Electron Devices,1983
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