Study of novel fully-depleted Ge-on-Insulator n-channel MOSFET with field plate structure for improvement in GIDL and on/off characteristics

Author:

Liu Xiangyu,Hu Huiyong,Wang Meng,Zhang Heming,Wang Bin,Shu Bin,Han Genquan

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference28 articles.

1. CMOS performance benchmarking of Si, InAs, GaAs, and Ge nanowire n- and pMOSFETs with Lg=13 nm based on atomistic quantum transport simulation including strain effects;Kim,2015

2. Enhanced hole mobility of Ge/GeSn pMOSFETs with a GeSnO interface layer and a NiGe Schottky source/drain;Zhao,2014

3. III–V/Ge MOSFETs and tunneling FETs on Si platform for low power logic applications;Takagi,2015

4. N-MOSFETs formed on solid phase epitaxially grown GeSn film with passivation by oxygen plasma featuring high mobility;Fang;Acs Appl. Mater. Interfaces,2015

5. Record hole mobility at high vertical fields in planar strained germanium on insulator with asymmetric strain;Chern;IEEE Electron Device Lett.,2014

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