A simple technique for the preparation of silicon thin foils for transmission electron microscopy-Reference-Cited by-同舟云学术

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A simple technique for the preparation of silicon thin foils for transmission electron microscopy

Published:1975-01 Issue:3-4 Volume:6 Page:121-122
ISSN:0047-7206
Container-title:Micron (1969)
language:en
Short-container-title:Micron (1969)

Author:

West A.W.,Richards B.P.

Publisher

Elsevier BV

Subject

Structural Biology,Cell Biology

Reference5 articles.

1. Method of preparing Si and Ge specimens for examination by transmission electron microscopy;Booker;Br. J. appl. Phys.,1962

2. Structure and origin of stacking faults in epitaxial silicon;Finch;J. appl. Phys.,1963

3. Specimen preparation in materials science;Goodhew,1972

4. A chemical thinniog technique for the simultaneous preparation of foils for transmission electron microscopy: application to yytrium aluminium garnet;Keast;J. scient. Instrum.,1967

5. Method for producing large Si films for preselected imperfection analysis;Lawrence;J. scient. Instrum.,1965

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thinning method for electron microscopy transparent silicon and germanium foils;Micron (1969);1978-01

2. The thinning of a silicon/silicon oxide wafer for transmission electron microscopy;Micron (1969);1977-01

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