Monte Carlo simulation of the formation of MCs+ molecular ions-Reference-Cited by-同舟云学术

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Monte Carlo simulation of the formation of MCs+ molecular ions

Published:1996-11 Issue:1-2 Volume:156 Page:61-66
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Vlekken J.,Wu T.D.,D'Olieslaeger M.,Knuyt G.,De Schepper L.,Stals L.M.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference11 articles.

1. SIMS IX Proceedings;Gao,1993

2. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets

3. II. The energy spectrum of ejected atoms during the high energy sputtering of gold

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H2, C2H2, CO, and O2;Journal of the American Society for Mass Spectrometry;2021-12-22

2. Secondary ion mass spectrometry of MCsn+ molecular ion complexes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-05

3. Energetics ofMCsn+molecular ions emitted fromCs+irradiated surfaces;Physical Review B;2004-11-18

4. Investigation of the formation process of MCs+-molecular ions during sputtering;Journal of the American Society for Mass Spectrometry;2000-07-01

5. Depth Profile Analysis of Ultrathin Silicon Oxynitride Films by ToF-SIMS;Journal of The Electrochemical Society;2000

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