Performance of the Silicon-On-Insulator pixel sensor for X-ray astronomy, XRPIX6E, equipped with pinned depleted diode structure-Reference-Cited by-同舟云学术

Performance of the Silicon-On-Insulator pixel sensor for X-ray astronomy, XRPIX6E, equipped with pinned depleted diode structure

Published:2019-04 Issue: Volume:924 Page:468-472
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Harada Sodai,Tsuru Takeshi Go,Tanaka Takaaki,Uchida Hiroyuki,Matsumura Hideaki,Tachibana Katsuhiro,Hayashi Hideki,Takeda Ayaki,Mori Koji,Nishioka Yusuke,Takebayashi Nobuaki,Yokoyama Shoma,Fukuda Kohei,Arai Yasuo,Kurachi Ikuo,Kawahito Shoji,Kagawa Keiichiro,Yasutomi Keita,Shrestha Sumeet,Nakanishi Syunta,Kamehama Hiroki,Kohmura Takayoshi,Hagino Kouichi,Negishi Kousuke,Oono Kenji,Yarita Keigo

Funder

Japan Society for the Promotion of Science (JSPS) KAKENHI, Japan

VLSI Design and Education Center (VDEC)

University of Tokyo

Cadence Design Systems, Inc.

Mentor Graphics, Inc.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. X-ray imaging spectrometer (XIS) on board Suzaku;Koyama;Publ. Astron. Soc. Japan,2007

2. Development and performance of Kyoto’s x-ray astronomical SOI pixel (SOIPIX) sensor;Tsuru,2014

3. Development of SOI pixel process technology;Arai;Nucl. Instrum. Methods Phys. Res. A,2011

4. Improvement of spectroscopic performance using a charge-sensitive amplifier circuit for an X-ray astronomical SOI pixel detector;Takeda;J. Instrum.,2015

5. Front-end electronics of double SOI X-ray imaging sensors;Miyoshi;J. Instrum.,2017

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1. Evaluation of the X-ray SOI pixel detector with the on-chip ADC;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-07

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4. Radiation-Induced Degradation Mechanism of X-Ray SOI Pixel Sensors With Pinned Depleted Diode Structure;IEEE Transactions on Nuclear Science;2023-07

5. Single event tolerance of x-ray silicon-on-insulator pixel sensors;Journal of Astronomical Telescopes, Instruments, and Systems;2022-10-18