Single event tolerance of x-ray silicon-on-insulator pixel sensors-Reference-Cited by-同舟云学术

Single event tolerance of x-ray silicon-on-insulator pixel sensors

Published:2022-10-18 Issue:04 Volume:8 Page:
ISSN:2329-4124
Container-title:Journal of Astronomical Telescopes, Instruments, and Systems
language:
Short-container-title:J. Astron. Telesc. Instrum. Syst.

Author:

Hagino Kouichi¹,Hayashida Mitsuki²,Kohmura Takayoshi²,Doi Toshiki²,Tsunomachi Shun²,Kitajima Masatoshi²,Tsuru Takeshi G.³,Uchida Hiroyuki³,Kayama Kazuho³,Mori Koji⁴,Takeda Ayaki⁴,Nishioka Yusuke⁴,Yukumoto Masataka⁴,Mieda Kira⁴,Yonemura Syuto⁴,Ishida Tatsunori⁴,Tanaka Takaaki⁵,Arai Yasuo⁶,Kurachi Ikuo⁷,Kitamura Hisashi⁸,Kawahito Shoji⁹,Yasutomi Keita⁹

Affiliation:

1. Kanto Gakuin University, Research Advancement and Management Organization, Yokohama, Japan

2. Tokyo University of Science, School of Science and Technology, Department of Physics, Noda, Japan

3. Kyoto University, Faculty of Science, Department of Physics, Kyoto, Japan

4. University of Miyazaki, Faculty of Engineering, Department of Applied Physics, Miyazaki, Japan

5. Konan University, Department of Physics, Higashinada, Kobe, Japan

6. High Energy Accelerator Research Organization (KEK), Open Innovation Promotion Department, Tsukuba, Japan

7. D&S Inc., Tokyo, Japan

8. National Institute of Radiological Sciences, National Institutes for Quantum and Radiological Science and Technology, Chiba, Japan

9. Shizuoka University, Research Institute of Electronics, Hamamatsu, Japan

Publisher

SPIE-Intl Soc Optical Eng

Subject

Space and Planetary Science,Mechanical Engineering,Astronomy and Astrophysics,Instrumentation,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

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