Development of a lens-coupled CMOS detector for an X-ray inspection system
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
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1. Intelligent X-ray inspection for quality control of solder joints
2. Development of an inspection process for ball-grid-array technology using scanned-beam X-ray laminography
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3. Spatial Resolution and Blurring Artifacts in Digital X-ray Tomosynthesis;IEEE Transactions on Nuclear Science;2018-05
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