Analyzing single event upset on Kintex-7 Field-Programmable-Gate-Array with random fault injection method-Reference-Cited by-同舟云学术

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Analyzing single event upset on Kintex-7 Field-Programmable-Gate-Array with random fault injection method

Published:2020-06 Issue: Volume:966 Page:163866
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Wang Zibo,Chen Wei,Yao Zhibin,Zhang Fengqi,Luo Yinhong,Tang Xiaobin,Peng Cong,Ding Lili,Guo Xiaoqiang

Funder

Major Program of the National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs;Ceschia;IEEE Trans. Nucl. Sci.,2003

2. A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5;Quinn,2007

3. A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAs;Sterpone;IEEE Trans. Nucl. Sci.,2005

4. Compact and fast fault injection system for robustness measurements on SRAM-based FPGAs;Kretzschmar;IEEE Trans. Ind. Electron.,2014

5. A new partial reconfiguration-based fault-injection system to evaluate SEU effects in SRAM-based FPGAs;Sterpone;IEEE Trans. Nucl. Sci.,2007

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip;Chinese Physics B;2024-06-01

2. Analysis of the impact on soft error in AXI CDMA based on Xilinx Zynq-7000 FPGA;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2022-08

3. Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis;Microelectronics Reliability;2021-05

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