Characterisation, simulation and test beam data analysis of stitched passive CMOS strip sensors-Reference-Cited by-同舟云学术

Characterisation, simulation and test beam data analysis of stitched passive CMOS strip sensors

Published:2024-04 Issue: Volume:1061 Page:169132
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Zatocilova Iveta^ORCID,Arling Jan-Hendrik^ORCID,Baselga Marta^ORCID,Davis Naomi,Diehl Leena^ORCID,Dingfelder Jochen,Gregor Ingrid-Maria^ORCID,Hauser Marc,Hemperek Tomasz^ORCID,Hügging Fabian^ORCID,Jakobs Karl,Karagounis Michael^ORCID,Koppenhöfer Roland^ORCID,Kröninger Kevin,Lex Fabian^ORCID,Parzefall Ulrich^ORCID,Rodriguez Arturo,Sari Birkan^ORCID,Sorgenfrei Niels^ORCID,Spannagel Simon^ORCID,Sperlich Dennis^ORCID,Wang Tianyang,Weingarten Jens^ORCID

Funder

Deutsche Gesellschaft für Parkinson und Bewegungsstörungen

Helmholtz Association

Helmholtz-Gemeinschaft

Institut "Jožef Stefan"

Publisher

Elsevier BV

Reference5 articles.

1. LFoundry S.r.l. Landshut, Ludwig-Erhard-Strasse 6A, 84034 Landshut, Germany;LFoundry,2021

2. Characterization of passive CMOS strip sensors;Diehl;Nucl. Instrum. Methods,2022

3. Synopsys TCAD, https://www.synopsys.com/silicon/tcad.html.

4. Evaluation of passive CMOS strip sensors;Diehl;Nucl. Instrum. Methods,2022

5. Alibava systems, https://alibavasystems.com/.

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1. Characterisation and simulation of stitched CMOS strip sensors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-07