Characterisation and simulation of stitched CMOS strip sensors
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Published:2024-07
Issue:
Volume:1064
Page:169407
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ISSN:0168-9002
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Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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language:en
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Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Author:
Davis NaomiORCID, Arling Jan-Hendrik, Baselga Marta, Diehl Leena, Dingfelder Jochen, Gregor Ingrid-Maria, Hauser Marc, Hügging Fabian, Hemperek Tomasz, Jakobs Karl, Karagounis Michael, Koppenhöfer Roland, Kröninger Kevin, Lex Fabian, Parzefall Ulrich, Rodriguez Arturo, Sari Birkan, Sorgenfrei Niels, Spannagel Simon, Sperlich Dennis, Wang Tianyang, Weingarten Jens, Zatocilova Iveta
Funder
Helmholtz Association Helmholtz-Gemeinschaft
Reference12 articles.
1. Stitching design rules for forming interconnect layers;Cohen,1999 2. LFoundry S.r.l;LFoundry,2024 3. Characterization of passive CMOS strip sensors;Diehl;Nucl. Instrum. Methods A,2022 4. The DESY II test beam facility;Diener;Nucl. Instrum. Methods A,2019 5. ADENIUM — A demonstrator for a next-generation beam telescope at DESY;Liu;J. Instrum.,2023
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