TCT characterization of different semiconductor materials for particle detection-Reference-Cited by-同舟云学术

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TCT characterization of different semiconductor materials for particle detection

Published:2006-09 Issue:1 Volume:565 Page:227-233
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Fink J.,Lodomez P.,Krüger H.,Pernegger H.,Weilhammer P.,Wermes N.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique

2. Element Six Ltd., King's Ride Park, Ascot, Berkshire SL58BP, UK.

3. Currents Induced by Electron Motion

4. Currents to Conductors Induced by a Moving Point Charge

5. J. Fink, P. Lodomez, H. Krüger, N. Wermes, Nucl. Instr. and Meth. A 560 (2006) 435.

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