Charge-collection properties of irradiated depleted CMOS pixel test structures-Reference-Cited by-同舟云学术

Charge-collection properties of irradiated depleted CMOS pixel test structures

Published:2018-09 Issue: Volume:903 Page:126-133
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Mandić I.,Cindro V.,Gorišek A.,Hiti B.,Kramberger G.,Zavrtanik M.,Mikuž M.,Hemperek T.

Funder

Slovenian Research Agency

Deutsche Forschungsgemeinschaft DFG

European Union’s Horizon 2020 Research and Innovation Programme

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference36 articles.

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