Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology-Reference-Cited by-同舟云学术

Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology

Published:2022-10 Issue: Volume:1040 Page:167213
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Bugiel Szymon^ORCID,Dorokhov Andrei,Aresti Mauro^ORCID,Baudot Jerome^ORCID,Beole Stefania^ORCID,Besson Auguste^ORCID,Bugiel Roma^ORCID,Cecconi Leonardo^ORCID,Colledani Claude,Deng Wenjing^ORCID,Di Mauro Antonello^ORCID,Bitar Ziad El,Goffe Mathieu^ORCID,Hasenbichler Jan,Hong Geun Hee,Hu-Guo Christine,Jaaskelainen Kimmo^ORCID,Kluge Alex,Mager Magnus,Marras Davide,de Melo Joao,Munker Magdalena,Pham Hung,Piro Francesco,Reidt Felix^ORCID,Rinella Gianluca Aglieri^ORCID,Russo Roberto^ORCID,Sarritzu Valerio^ORCID,Senyukov Serhiy,Snoeys Walter^ORCID,Suljic Miljenko,Usai Gianluca^ORCID,Valin Isabelle,Winter Marc,Wu Yitao

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference4 articles.

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2. E.D.R.R.P. Group, The 2021 ECFA detector research and development roadmap, Tech. Rep., Geneva, 2020, http://dx.doi.org/10.17181/CERN.XDPL.W2EX, URL.

3. Expression of interest for an ALICE ITS upgrade in LS3,2018

4. Simulations of CMOS pixel sensors with a small collection electrode, improved for a faster charge collection and increased radiation tolerance;Munker;J. Instrum.,2019

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1. Characterisation of analogue MAPS fabricated in 65 nm technology for the ALICE ITS3;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-11

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3. A readout system for monolithic pixel sensor prototypes towards the upgrade of the ALICE Inner Tracking System;Journal of Instrumentation;2023-01-01