Characterisation of analogue MAPS fabricated in 65 nm technology for the ALICE ITS3

Author:

Gautam KunalORCID,Kumar AjitORCID

Funder

Horizon 2020

FWO

SNF

Publisher

Elsevier BV

Reference6 articles.

1. Technical Design Report for the ALICE Inner Tracking System 3 – ITS3 ; A Bent Wafer-Scale Monolithic Pixel Detector,2024

2. A process modification for CMOS monolithic active pixel sensors for enhanced depletion, timing performance and radiation tolerance;Snoeys;Nucl. Instrum. Methods Phys. Res. A,2017

3. Simulations of CMOS pixel sensors with a small collection electrode, improved for a faster charge collection and increased radiation tolerance;Munker;J. Instrum.,2019

4. Characterisation of analogue monolithic active pixel sensor test structures implemented in a 65 nm CMOS imaging process;Rinella,2024

5. Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology;Bugiel;Nucl. Instrum. Methods Phys. Res. A,2022

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