Hard X-ray nanoprobe at beamline P06 at PETRA III-Reference-Cited by-同舟云学术

Hard X-ray nanoprobe at beamline P06 at PETRA III

Published:2010-05 Issue:2-3 Volume:616 Page:93-97
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Schroer Christian G.,Boye Pit,Feldkamp Jan M.,Patommel Jens,Samberg Dirk,Schropp Andreas,Schwab Andreas,Stephan Sandra,Falkenberg Gerald,Wellenreuther Gerd,Reimers Nadja

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Efficient sub 100nm focusing of hard x rays

2. 30nm resolution x-ray imaging at 8keV using third order diffraction of a zone plate lens objective in a transmission microscope

3. Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution

4. Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

5. Wedged multilayer Laue lens

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