The sensitivity and spatial resolution dependence on the microstructures of CsI:Tl scintillation layer for X-ray imaging detectors-Reference-Cited by-同舟云学术

The sensitivity and spatial resolution dependence on the microstructures of CsI:Tl scintillation layer for X-ray imaging detectors

Published:2011-05 Issue: Volume:633 Page:S297-S299
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Cha Bo Kyung,Hyung Bae Jun,Lee Chae-hun,Chang Sungho,Cho Gyuseong

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. Recent developments in digital radiography detectors

2. Scintillation efficiency, structure and spatial resolution of CsI(Tl) layers

3. Scintillation characteristics and imaging performance of CsI:Tl thin films for X-ray imaging applications

4. B.J. Kim, G. Cho, B.K. Cha, D.K. Kim, J. Whang, J.W. Park, C.H. Kim, M. Jae, J.K. Kim, in: SCINT 2005 Book of Abstracts, Institute for Scintillation Materials, Ukraine, 2005, p. 260.

5. Performance studies of a monolithic scintillator-CMOS image sensor for X-ray application

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