TCT measurements with slim edge strip detectors-Reference-Cited by-同舟云学术

TCT measurements with slim edge strip detectors

Published:2014-07 Issue: Volume:751 Page:41-47
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Mandić Igor,Cindro Vladimir,Gorišek Andrej,Kramberger Gregor,Mikuž Marko,Zavrtanik Marko,Fadeyev Vitaliy,Sadrozinski Hartmut F.-W.,Christophersen Marc,Phlips Bernard

Funder

European Commission under the FP7 Research Infrastructures project AIDA

Office of Naval Research

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. R. Bates et al., Characterisation of edgeless technologies for pixelated and strip silicon detectors with a micro-focused x-ray beam, 2013, JINST 8 P01018.

2. Final size planar edgeless silicon detectors for the TOTEM experiment

3. Active-edge planar radiation sensors

4. 3D processing on 6in. high resistive SOI wafers: Fabrication of edgeless strip and pixel detectors

5. S. Altenheiner, C. Gossling, J. Jentzsch, R. Klingenberg, T. Lapsien, et al., Planar slim-edge pixel sensors for the ATLAS upgrades, 2012 JINST 7 C02051.

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