Computer simulation of time-of-flight mass spectrometers: calculations of mass spectra and spatial distributions of ions-Reference-Cited by-同舟云学术

Computer simulation of time-of-flight mass spectrometers: calculations of mass spectra and spatial distributions of ions

Published:2004-02 Issue:1-2 Volume:519 Page:345-352
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Veryovkin Igor V.,Chen Chun-Yen,Calaway Wallis F.,Pellin Michael J.,Lee Typhoon

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. D.A. Dahl, SIMION 3D Version 6.0. 43rd ASMS Conference on Mass Spectrometry and Allied Topics, May 21–26 1995, Atlanta, Georgia, p. 717.

2. I.V. Veryovkin, W.F. Calaway, M.J. Pellin, Ion Optics of a New Time-Of-Flight Mass Spectrometer For Quantitative Surface Analysis, Proceedings of CPO-6, Nucl. Instr. and Meth. A, 2004, these Proceedings.

3. Sputtering by Particle Bombardment I;Sigmund,1981

4. Energy and angular distributions of sputtered particles

5. M.J. Pellin, W.F. Calaway, I.V. Veryovkin, in: J. Vickerman, D. Briggs (Eds.), ToF-SIMS: Surface Analysis by Mass Spectrometry, Surface Spectra Ltd., Manchester, and IM Publications, Chichester, 2001, p. 375.

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