1. Development of radiation hard sensors for very high luminosity colliders—CERN-RD50 project
2. I. Pintilie, TSC method, presentation at RD50 workshop on defect analysis in radiation damaged detectors, Hamburg, 2006; I. Pintilie, E. Fretwurst, G. Lindström, J. Stahl, F. Hoenniger, TSC results, 〈http://wwwiexp.desy.de/seminare/defect.analysis.workshop.august.2006.html〉.
3. Determination of the Fermi level position for neutron irradiated high resistivity silicon detectors and materials using the transient charge technique (TChT)
4. G. Kramberger, Charge trapping, Presentation at RD50 workshop on defect analysis in radiation damaged detectors, Hamburg, 2006 〈http://wwwiexp.desy.de/seminare/defect.analysis.workshop.august.2006.html〉.
5. O. Krasel, C. Gossling, J. Klaiber-Lodewigs, R. Klinenberg, M. Mass, S. Rajek, R. Wunstorf, Measurement of trapping time constants in proton-irradiated silicon pad detectors, Presentation at RD50 workshop, CERN Geneva, 2003 〈http://rd50.web.cern.ch/rd50/3rd-workshop〉.