Scribe–cleave–passivate (SCP) slim edge technology for silicon sensors-Reference-Cited by-同舟云学术

Scribe–cleave–passivate (SCP) slim edge technology for silicon sensors

Published:2013-12 Issue: Volume:731 Page:260-265
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Fadeyev V.,Sadrozinski H.F.-W.,Ely S.,Wright J.G.,Christophersen M.,Phlips B.F.,Pellegrini G.,Grinstein S.,Dalla Betta G.-F.,Boscardin M.,Klingenberg R.,Wittig T.,Macchiolo A.,Weigell P.,Creanza D.,Bates R.,Blue A.,Eklund L.,Maneuski D.,Stewart G.,Casse G.,Gorelov I.,Hoeferkamp M.,Metcalfe J.,Seidel S.,Kramberger G.

Funder

Office of Naval Research (ONR)

Department of Energy

Spanish Ministry of Education and Science through the Particle Physics National Program

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. Issues in Proton Computed Tomography

2. The ATLAS Planar Pixel Sensor R&D project

3. Alumina and silicon oxide/nitride sidewall passivation for P- and N-type sensors

4. The effect of different dicing methods on the leakage currents of n-type silicon diodes and strip sensors

5. Development of n-in-p silicon planar pixel sensors and flip-chip modules for very high radiation environments

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