KITE: High frame rate, high count rate pixelated electron counting ASIC for 4D STEM applications featuring high-Z sensor

Author:

Zambon P.ORCID,Bottinelli S.ORCID,Schnyder R.,Musarra D.ORCID,Boye D.,Dudina A.,Lehmann N.ORCID,De Carlo S.ORCID,Rissi M.,Schulze-Briese C.,Meffert M.,Campanini M.,Erni R.,Piazza L.

Funder

Innosuisse Swiss Innovation Agency

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference41 articles.

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2. Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond;Ophus;Microsc. Microanal.,2019

3. Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization;MacLaren;APL Mater.,2020

4. Electric field imaging of single atoms;Shibata;Nature Commun.,2017

5. Periodic giant polarization gradients in doped BiFeO3 thin films;Campanini;Nano Lett.,2018

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