Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization-Reference-Cited by-同舟云学术

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Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization

Published:2020-11-01 Issue:11 Volume:8 Page:110901
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

MacLaren Ian¹^ORCID,Macgregor Thomas A.¹^ORCID,Allen Christopher S.²³^ORCID,Kirkland Angus I.²³

Affiliation:

1. School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom

2. Electron Physical Science Imaging Centre, Diamond Lightsource Ltd., Harwell OX11 0DE, United Kingdom

3. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom

Funder

Diamond Light Source

Engineering and Physical Sciences Research Council

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0026992

Reference148 articles.

1. Berechnung der Bahn von Kathodenstrahlen im axialsymmetrischen elektromagnetischen Felde

2. Das Elektronenmikroskop

3. �ber Fortschritte im Bau und in der Leistung des magnetischen Elektronenmikroskops

4. �ber einige Fehler von Elektronenlinsen

5. The Theoretical Resolution Limit of the Electron Microscope

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2. High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques;Journal of Microscopy;2024-05-06

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4. Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors;Ultramicroscopy;2024-03

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