1. A. Rommeveaux, M. Thomasset, D. Cocco, F. Siewert, in: A. Erko, et al., (Eds.), Modern developments in X-ray and Neutron Optics, Springer series in optical Sciences, Vol. 137, 2008, pp. 181–191.
2. A. Rommeveaux, L. Assoufid, H. Ohashi, H. Mimura, K. Yamauchi, J. Qian, T. Ishikawa, C. Morawe, A.T. Macrander, A. Khounsary, S. Goto, Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-X-ray mirrors, in: Advances in Metrology for X-ray and EUV Optics II, San Diego, CA, USA-2007-08-30, Proceedings SPIE 6704, 67040B-1-67040B-12, 2007.
3. F. Polack, M. Thomasset, Simultaneous estimation of the surface shape and the instrument error function from a highly redundant set of LTP data, in: Second Workshop on Active X-ray Optics, 9–11 October 2008, Trieste Italy, 〈http://elettra.trieste.it/actop08/uploads/Main/p13.pdf〉.
4. E. Anderson, Z. Bai, C. Bischof, J. Demmel, J.J. Dongarra, J.J. Du Croz, A. Greenbaum, S. Hammarling, A. McKenney, S. Blackford, D. Sorensen, LAPACK Users’ Guide, third ed., SIAM, Philadelphia, 1999; inline version: 〈http://www.netlib.org/lapack/lug/lapack_lug.html〉 page 〈http://www.netlib.org/lapack/lug/node39.html〉.
5. OriginLab Corporation, Northampton, MA, 01060 USA.