Metrology of multilayer Laue lens structures by means of scanning electron microscope imaging
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
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1. Multilayer Laue Lens: A Brief History and Current Status;Synchrotron Radiation News;2016-07-03
2. X-ray nanometer focusing at the SSRF based on a multilayer Laue lens;Chinese Physics C;2015-12
3. Efficiency of a multilayer-Laue-lens with a 102 μm aperture;Applied Physics Letters;2015-08-24
4. Analysis of tilted multilayer Laue lens with stochastic layer thickness error;Optics Communications;2014-08
5. Hard x-ray nanofocusing by multilayer Laue lenses;Journal of Physics D: Applied Physics;2014-06-05
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