Author:
Liu Jing,Chen Wei,Wang Zujun,Xue Yuanyuan,Yao Zhibin,He Baoping,Ma Wuying,Jin Junshan,Sheng Jiangkun,Dong Guantao
Funder
National Science Foundation of China
Foundation of State Key Laboratory of China
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
7 articles.
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1. A simulation result of trapped charge in PPD CIS induced by total ionizing dose effect;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-05
2. 位移损伤诱发CMOS图像传感器电荷转移损失退化的理论模拟研究;Acta Optica Sinica;2022
3. Mitigating charge spill-back induced image lag with a multi-level transfer gate pulse in PPD image sensors;X-Ray, Optical, and Infrared Detectors for Astronomy IX;2020-12-13
4. Heavy ion-induced single event effects in active pixel sensor array;Solid-State Electronics;2019-02
5. Measurement and analysis of the conversion gain degradation of the CIS detectors in harsh radiation environments;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2018-07