Measurement and analysis of the conversion gain degradation of the CIS detectors in harsh radiation environments-Reference-Cited by-同舟云学术

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Measurement and analysis of the conversion gain degradation of the CIS detectors in harsh radiation environments

Published:2018-07 Issue: Volume:895 Page:35-39
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Wang Zujun,Xue Yuanyuan,Guo Xiaoqiang,Bian Jingying,Yao Zhibin,He Baoping,Ma Wuying,Sheng Jiangkun,Dong Guantao,Liu Yan

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology

2. Characterization of CMOS Active Pixel Sensors for particle detection: Beam test of the four-sensors RAPS03 stacked system

3. CMOS active pixel sensors for ionising radiation

4. CMOS monolithic active pixel sensors (MAPS) for scientific applications: Some notes about radiation hardness

5. CMOS sensors for the vertex detector of the future international linear collider

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1. CMOS图像传感器质子位移损伤效应实验与分析;Acta Optica Sinica;2024

2. 不同能量质子辐照诱发CCD图像传感器性能退化实验与分析;Acta Optica Sinica;2023

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