A probabilistic model for measurement processes-Reference-Cited by-同舟云学术

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A probabilistic model for measurement processes

Published:2003-09 Issue:2 Volume:34 Page:85-99
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Rossi Giovanni B.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference44 articles.

1. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, International Vocabulary of Basic and general terms in Metrology, Second Edition, 1994.

2. Recommendation INC-1, 1980, Expression of experimental uncertainties.

3. Recommendation 1 Cl-1981, Expression of experimental uncertainties.

4. Recommendation 1 Cl-1986, Expression of uncertainties in work carried out under the auspices of the CIPM.

5. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, Guide to the expression of uncertainty in measurement, ISO Genève, 1993.

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