Polarization metrology: Alignment of polarizing prisms in optical polarization systems-Reference-Cited by-同舟云学术

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Polarization metrology: Alignment of polarizing prisms in optical polarization systems

Published:2013-12 Issue: Volume:54 Page:42-44
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

Nagib N.N.,Bahrawi M.S.,Ismail L.Z.,Othman M.H.,Abdallah A.W.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Azimuthal misalignment and surface anisotropy as sources of error in ellipsometry;Dignam;Applied Optics,1970

2. The polarimetric determination of optical properties;Emberson;Journal of the Optical Society of America,1936

3. Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry;McCrackin;Journal of Research of the National Bureau of Standards—A. Physics and Chemistry,1963

4. Method for calibrating the analyzer and the polarizer in an ellipsometer;Ghezzo;British Journal of Applied Physics (Journal of Physics D),1969

5. Two alignment methods for the polarizer and analyzer in an ellipsometer;Liljenvall;Applied Optics,1970

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