Surface defect detection of solar cells based on Fourier single-pixel imaging for removal of substrates interference
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Published:2024-05
Issue:
Volume:176
Page:108073
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ISSN:0143-8166
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Container-title:Optics and Lasers in Engineering
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language:en
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Short-container-title:Optics and Lasers in Engineering
Author:
Ma Jun,
Gao Xicheng,
Wang Jiaqi,
Guan QingtianORCID,
Deng HuaxiaORCID,
Gong Xinglong,
Ma MengchaoORCID,
Zhong XiangORCID