Single-shot wavelength meter on a chip based on exponentially increasing delays and in-phase quadrature detection
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Published:2024-07
Issue:
Volume:178
Page:108163
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ISSN:0143-8166
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Container-title:Optics and Lasers in Engineering
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language:en
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Short-container-title:Optics and Lasers in Engineering
Author:
Coggrave C.R.ORCID,
Ruiz P.D.ORCID,
Pallikarakis C.A.,
Huntley J.M.ORCID,
Du H.,
Banakar M.,
Yan X.ORCID,
Tran D.T.,
Littlejohns C.G.ORCID