Surface Shape Measurement by Wavelength Scanning Interferometry Using an Electronically Tuned Ti:sapphire Laser-Reference-Cited by-同舟云学术

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Surface Shape Measurement by Wavelength Scanning Interferometry Using an Electronically Tuned Ti:sapphire Laser

Published:2001-01 Issue:1 Volume:8 Page:59-63
ISSN:1340-6000
Container-title:Optical Review
language:en
Short-container-title:OPT REV

Author:

Yamamoto Akihiro,Kuo Chih-Che,Sunouchi Kei,Wada Satoshi,Yamaguchi Ichirou,Tashiro Hideo

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics

Link

http://link.springer.com/content/pdf/10.1007/s10043-001-0059-8.pdf

Reference12 articles.

1. M. Takeda and H. Yamamoto: Appl. Opt. 34 (1994) 7829.

2. T. H. Barnes, T. Eiju and K. Matsuda: Optik 103 (1996) 93.

3. H. J. Tiziani, B. Franze and P. Haible: J. Mod. Opt. 44 (1997) 1485.

4. M. Kinoshita, M. Takeda, H. Yago, Y. Watanabe and T. Kurokawa: Appl. Opt. 38 (1999) 7063.

5. S. Kuwamura and I. Yamaguchi: Appl. Opt. 36 (1996) 4473.

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