Terahertz ellipsometry based on the long-distance diffraction-free beam

Author:

Huang QianORCID,Liu Wei,Han Meiyao,Yang Zhengang,Liu Jinsong,Wang Kejia

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference33 articles.

1. Spectroscopic ellipsometry: principles and applications;Fujiwara,2007

2. Industrial applications of spectroscopic ellipsometry;Tompkins;Thin Solid Film,2004

3. Spectroscopic ellipsometry for inline process control in the semiconductor industry;Zollner,2013

4. In-situ ellipsometric study of the optical properties of LTL-doped thin film sensors for copper(II) ion detection;Cody;Coatings,2020

5. Spectroscopic ellipsometry characterization of multilayer optical coatings;Hilfiker;Surface Coat Technol,2019

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