Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation-Reference-Cited by-同舟云学术

Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation

Published:2001-01 Issue:10-11 Volume:21 Page:2135-2139
ISSN:0955-2219
Container-title:Journal of the European Ceramic Society
language:en
Short-container-title:Journal of the European Ceramic Society

Author:

Cho Yasuo,Ohara Koya,Kazuta Satoshi,Odagawa Hiroyuki

Publisher

Elsevier BV

Subject

Materials Chemistry,Ceramics and Composites

Reference5 articles.

1. Cho, Y., Kirihara, A. and Saeki. T, Hisenkei yuudenritu bunpu you kenbikyou. Denshi Joho Tsushin Gakkai Ronbunshi, 1995, 78-c-1, 593 (in Japanese).

2. Scanning nonlinear dielectric microscope;Cho;Rev. Sci. Instrum.,1996

3. Scanning nonlinear Dielectric microscopy with nanometer resolution;Cho;Appl. Phys. Lett.,1999

4. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope;Gao;Appl. Phys. Lett.,1997

5. Dynamic measuring method of capacitance variation of piezoelectric ceramics with alternating electric Field;Cho;Jpn. J. Appl. Phys.,1992

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