Nature of the structural heterogeneity in SiH films by small angle neutron scattering
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference9 articles.
1. Microstructure of plasma‐deposited a‐Si : H films
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1. Small-angle x-ray scattering in amorphous silicon: A computational study;Physical Review B;2018-05-02
2. Dielectric function ofa-Si:H based on local network structures;Physical Review B;2011-05-05
3. Neutron scattering studies of hydrogenated, deuterated and fluorinated amorphous silicon;Journal of Physics: Condensed Matter;2007-09-27
4. The long-range ordering, electron spectrum, and properties of amorphous silicon films – I. The generalized Skettrup model;Physica B: Condensed Matter;2003-09
5. Small-Angle Neutron Scattering from Device-Quality a-Si:H and a-Si:D Prepared by PECVD and HWCVD;MRS Proceedings;2000
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