A comparison of picts with direct measurements of non-exponential current transients on Si-GaAs
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference13 articles.
1. Deep‐level spectroscopy in high‐resistivity materials
2. Photo-induced transient spectroscopy PITS study on undoped LEC grown semi-insulating GaAs
3. Investigation of deep levels in high-resistivity bulk materials by photo-induced current transient spectroscopy. I. Review and analysis of some basic problems
4. Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. I. Computer Controlled Multi-Channel PICTS System with High-Resolution
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Native hole traps of ferromagnetic Ga1−xMnxAs layers on (100) GaAs substrates;Applied Physics Letters;2003-11-24
2. Complete set of deep traps in semi-insulating GaAs;Journal of Applied Physics;2000
3. Identification of deep defects in high-resistivity undoped LEC-GaAs irradiated with protons;Journal of Physics D: Applied Physics;1996-12-14
4. Distinction between electron and hole traps in semi‐insulating GaAs;Journal of Applied Physics;1996-05-01
5. Photo-induced current spectroscopy study on semi-insulating LEC GaAs;Journal of Physics D: Applied Physics;1996-04-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3