Long range migration of niobium during the anodic oxidation of tantalum on niobium and aluminum on niobium duplex layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference10 articles.
1. The mechanism of anodic oxidation
2. The Migration of Metal and Oxygen during Anodic Film Formation
3. The Migration of Oxygen during the Anodic Oxidation of Tantalum
4. The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l
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3. Structure, Morphology, and Dielectric Properties of Nanocomposite Oxide Films Formed by Anodizing of Sputter-Deposited Ta-Al Bilayers;Journal of The Electrochemical Society;2004
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