Measurement of atomic forces between surface atoms using an ultra-clean AFM incorporated in an XHV integrated system-Reference-Cited by-同舟云学术

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Measurement of atomic forces between surface atoms using an ultra-clean AFM incorporated in an XHV integrated system

Published:1997-09 Issue: Volume:71-72 Page:233-241
ISSN:0001-8686
Container-title:Advances in Colloid and Interface Science
language:en
Short-container-title:Advances in Colloid and Interface Science

Author:

Tosa Masahiro

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry,Physical and Theoretical Chemistry,Surfaces and Interfaces

Reference8 articles.

1. Atomic Force Microscope

2. Extremely high vacuum system for long-distance transport

3. Magnetic Levitation Transport System for Extremly High Vacuum.

4. M. Tosa, A. Itakura and K. Yoshihara, Vacuum, to be published.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applications of Atomic Force Microscope (AFM) in the Field of Nanomaterials and Nanocomposites;Functional Nanostructures;2008

2. Microscopy of Coatings;Encyclopedia of Analytical Chemistry;2006-09-15

3. Effects of three-dimensional atomic forces in topographical imaging of atoms with an atom force microscope;Physical Review B;2003-12-02

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