Author:
Gapinski Bartosz,Wieczorowski Michał,Marciniak-Podsadna Lidia,Dybala Bogdan,Ziolkowski Grzegorz
Reference20 articles.
1. J.P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, L. De Chiffre, A. Weckenmann, Computed tomography for dimensional metrology, CIRP Annals - Manufacturing Technology 60 (2011), pp. 821-842.
2. S. Carmignato, E. Savio, Traceable volume measurements using coordinate measuring systems, CIRP Annals - Manufacturing Technology 60 (2011), pp. 519-522.
3. J. Banhart, Advanced Tomographic Methods in Materials Research and Engineering, Oxford University Press, 2008.
4. S. Bushong, Computed Tomography, McGraw-Hill, 2000.
5. T.M. Buzug, Computed Tomography: From Photon Statistics to Modern Cone-Beam CT, Springer, 2008.
Cited by
59 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献