The effect of the substrate material on sims analysis of aerosols-Reference-Cited by-同舟云学术

The effect of the substrate material on sims analysis of aerosols

Published:1984-04 Issue:1 Volume:35 Page:1-12
ISSN:0048-9697
Container-title:Science of The Total Environment
language:en
Short-container-title:Science of The Total Environment

Author:

Klaus N.

Publisher

Elsevier BV

Subject

Pollution,Waste Management and Disposal,Environmental Chemistry,Environmental Engineering

Reference8 articles.

1. The size distributions of the urban aerosol in Vienna;Berner;Sci. Total Environ.,1979

2. Solid surfaces analysis;Higatsberger;Adv. Electron. Electron Phys.,1981

3. An analytical system for secondary ion mass spectrometry in ultra high vacuum;Huber;J. Vac. Sci. Technol.,1971

4. A new UHV-specimen preparation chamber for solid surface analysis with sample transport mechanism over a UHV-sluice lock to a SIMS-apparatus;Klaus,1977

5. Investigation of anodic silicon-oxide surface layers with the aid of SIMS;Klaus;Vacuum,1982

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1. Microscopy and Microanalysis of Individual Collected Particles;Aerosol Measurement;2011-07-07

2. Imaging of aerosols using time of flight secondary ion mass spectrometry;Applied Surface Science;2007-05

3. Analysis of organic and inorganic species on the surface of atmospheric aerosol using time-of-flight secondary ion mass spectrometry (TOF-SIMS);Atmospheric Environment;2002-12

4. Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates;Atmospheric Environment;2002-02

5. SIMS analysis of motor vehicle flue gas aerosols;Science of The Total Environment;1985-07