Solid Surfaces Analysis-Reference-Cited by-同舟云学术

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Solid Surfaces Analysis

Published:1981 Issue: Volume: Page:291-358
ISSN:0065-2539
Container-title:Advances in Electronics and Electron Physics Volume 56
language:
Short-container-title:

Author:

Higatsberger Michael J.

Publisher

Elsevier

Reference72 articles.

1. “Ellipsometry and Polarized Light.”;Azzam,1977

2. Backx, C., and Van der Wiel, M.J. (1974). Proc. Int. Conf. Vacuum. Ultraviolet Radiat. Phys. 4th.

3. Sputtering by Particle Bombardment,1980

4. Surface Investigation of Solids by Secondary Ion Mass Spectrometry (SIMS). DECHEMA;Benninghoven;Monoqr.,1975

5. “Secondary Ion Mass Spectrometry SIMS II.”,1979

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface and Thin Film Analysis, 1. General;Ullmann's Encyclopedia of Industrial Chemistry;2011-10-15

2. Surface and Thin-Film Analysis;Ullmann's Encyclopedia of Industrial Chemistry;2002-01-15

3. Profiling of the dielectric function across Al/SiO2/Si heterostructures with electron energy loss spectroscopy;Ultramicroscopy;1992-04

4. SIMS analysis of motor vehicle flue gas aerosols;Science of The Total Environment;1985-07

5. A dual beam gun for neutral or ionic primary beams in static SIMS;Vacuum;1985-03

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