A post-column imaging energy filter with a 20482-pixel slow-scan CCD camera-Reference-Cited by-同舟云学术

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A post-column imaging energy filter with a 20482-pixel slow-scan CCD camera

Published:1998-02 Issue:1 Volume:29 Page:81-87
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Gubbens Alexander J.,Brink Harold A.,Kundmann Mike K.,Friedman Stuart L.,Krivanek Ondrej L.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference10 articles.

1. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,1996

2. An imaging filter for high voltage electron microscopy;Gubbens;Ultramicroscopy,1995

3. Test and improved design of a corrected imaging energy filter;Lanio;Optik,1986

4. Developments in EELS instrumentation for spectroscopy and imaging;Krivanek;Microscopy, Microanalysis, Microstructures,1991

5. Design and first applications of a post-column imaging filter;Krivanek;Microscopy, Microanalysis, Microstructures,1992

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2. Electron-Optical Analytical Techniques;Characterization of Nanostructures;2012-06-13

3. The GIF Quantum, a next generation post-column imaging energy filter;Ultramicroscopy;2010-07

4. Transmission Electron Microscopy;Handbook of Surface and Interface Analysis;2009-06-24

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