Aberration Correctors, Monochromators, Spectrometers-Reference-Cited by-同舟云学术

Aberration Correctors, Monochromators, Spectrometers

Published:2019 Issue: Volume: Page:625-675
ISSN:2522-8692
Container-title:Springer Handbook of Microscopy
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Author:

Hawkes Peter W.^ORCID,Krivanek Ondrej L.

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-030-00069-1_13

Reference368 articles.

1. O. Scherzer: Über einige Fehler von Elektronenlinsen, Z. Phys. 101, 593–603 (1936)

2. O. Scherzer: Sphärische und chromatische Korrektur von Elektronenlinsen, Optik 2, 114–132 (1947)

3. A. Septier: The struggle to overcome spherical aberration in electron optics, Adv. Opt. Electron Microsc. 1, 204–274 (1966)

4. A. Septier: The struggle to overcome spherical aberration in electron optics, Adv. Imaging Electron Phys. 202, 75–147 (2017)

5. P.W. Hawkes: Methods of computing optical properties and combating aberrations for low-intensity beams, Adv. Electron. Electron Phys. Suppl. 13A, 45–157 (1980)

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