Author:
Whitlow Harry J.,Hautala Mikko,Sundqvist Bo U.R.
Cited by
14 articles.
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1. Imaging Secondary Ion Mass Spectroscopy;Handbook of Nanoscopy;2012-05-23
2. Ion Beam Techniques;Handbook of Surface and Interface Analysis;2009-06-24
3. Angular and lateral spreading of ion beams in biomedical nuclear microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-06
4. Low-energy primary knock on atom damage distributions near MeV proton beams focused to nanometre dimensions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-07
5. Bandgap modification in GaInAs/InP quantum well structures using switched ion channelling lithography;Semiconductor Science and Technology;2001-09-27