Imaging Secondary Ion Mass Spectroscopy-Reference-Cited by-同舟云学术

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Imaging Secondary Ion Mass Spectroscopy

Published:2012-05-23 Issue: Volume: Page:709-744
ISSN:
Container-title:Handbook of Nanoscopy
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Author:

Moore Katie L.,Schröder Markus,Grovenor Chris R. M.

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference85 articles.

1. Theory of sputtering. I. Sputtering yield of amorphous and polycrystalline targets;Sigmund;Phys. Rev.,1969

2. CAMECA http://www.cameca.com/instruments-for-research/sims-static.aspx

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evidence of hydrogen trapping at second phase particles in zirconium alloys;Scientific Reports;2021-02-23

2. Characterisation of deuterium distributions in corroded zirconium alloys using high-resolution SIMS imaging;Acta Materialia;2020-11

3. 3D-characterization of deuterium distributions in zirconium oxide scale using high-resolution SIMS;Applied Surface Science;2019-01

4. Environmentally-assisted grain boundary attack as a mechanism of embrittlement in a nickel-based superalloy;Acta Materialia;2017-03

5. High-resolution three-dimensional compositional imaging by double-pulse laser-induced breakdown spectroscopy;Journal of Instrumentation;2016-08-01

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