Ion microscope and ion microprobe analysis under oxygen, cesium and gallium bombardment-Reference-Cited by-同舟云学术

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Ion microscope and ion microprobe analysis under oxygen, cesium and gallium bombardment

Published:1995-05 Issue: Volume:143 Page:51-63
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Migeon H.-N.,Saldi F.,Gao Y.,Schuhmacher M.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference11 articles.

1. Secondary Ion Mass Spectrometry SIMS VIII;Migeon,1992

2. Secondary Ion Mass Spectrometry SIMS VIII;Schwieters,1992

3. Secondary Ion Mass Spectrometry SIMS V;Levi Setti,1986

4. Secondary Ion Mass Spectrometry SIMS VIII;Slodzian,1992

5. Secondary Ion Mass Spectrometry SIMS9 proceedings;Levi-Setti,1994

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