Fast-atom molecular secondary-ion mass spectrometry
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference26 articles.
1. Fast atom bombardment mass spectrometry
2. Molecular secondary ion mass spectrometry (SIMS)
3. Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry
4. Molecular secondary ion mass spectrometry
5. Characterization of solids and surfaces using ion beams and mass spectrometry
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1. Performance of an inductively coupled plasma source ion trap mass spectrometer;Journal of Analytical Atomic Spectrometry;1994
2. Ion-trap mass spectrometry with an inductively coupled plasma source;Rapid Communications in Mass Spectrometry;1994-01
3. An empirical model for ion formation from polymer surfaces during analysis by secondary ion mass spectrometry;International Journal of Mass Spectrometry and Ion Processes;1992-12
4. Pulsed fast atom bombardment sample desorption with multiphoton ionization in a supersonic jet/reflectron time-of-flight mass spectrometer;Analytical Chemistry;1991-05-15
5. Time-of-flight mass spectrometry: An increasing role in the life sciences;Biological Mass Spectrometry;1989-08
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