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Surface Topography Characterisation

Published:2014 Issue: Volume: Page:241-294
ISSN:
Container-title:Fundamental Principles of Engineering Nanometrology
language:
Short-container-title:

Author:

Leach Richard

Publisher

Elsevier

Reference80 articles.

1. Optical Shop Testing;Malacara,2007

2. Handbook of Optical Dimensional Metrology;Harding,2013

3. The parameter rash – is there a cure?;Whitehouse;Wear,1982

4. Stout 1941–2006: a memorial;Thomas;Wear,2008

5. The Development of Methods for the Characterization of Roughness in Three Dimensions;Stout,1993

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