Role of optical measurement systems in analysing the surface topography of an industry standard component

Author:

Walczak D.,Krolczyk J.B.ORCID,Chudy R.,Gupta Munish Kumar,Pruncu C.,Krolczyk G.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

1. On-machine and in-process surface metrology for precision manufacturing;Gao;CIRP Ann.,1986

2. Some considerations about the use of contact and confocal microscopy methods in surface texture measurement;García;Mater. (Basel),2018

3. Comparative assessment of the surface topography for different optical profilometry techniques after dry turning of Ti6Al4V titanium alloy;Leksycki;Meas. J. Int Meas. Confed.,2021

4. Paradigm shifts in surface metrology;Jiang;Part Ii. Curr. shift. Proc. R. Soc. A Math. Phys. Eng. Sci.,2007

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