Determination of the inelastic mean free path (IMFP) of electrons in germanium and silicon by elastic peak electron spectroscopy (EPES) using an analyser of high resolution-Reference-Cited by-同舟云学术

Determination of the inelastic mean free path (IMFP) of electrons in germanium and silicon by elastic peak electron spectroscopy (EPES) using an analyser of high resolution

Published:1997-09 Issue:7-9 Volume:48 Page:621-624
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Gergely G,Konkol A,Menyhard M,Lesiak B,Jablonski A,Varga D,Toth J

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference24 articles.

1. American society for testing and materials, standard definitions of terms relating to surface analysis (E673-82)

2. American Society for Testing and Materials standard definitions of terms relating to surface analysis (E 673-85b)

3. Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy

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