Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference73 articles.
1. Effects of Auger electron elastic scattering in quantitative AES
2. Comparison of electron attenuation lengths and escape depths with inelastic mean free paths
3. Influence of the matrix on boron detection by auger electron spectroscopy (AES)
4. Comparison of the attenuation lengths and the inelastic mean‐free path for photoelectrons in silver
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